Characterization Equipment is used to analyze materials and devices down to the nano scale. Included in this category are instruments for microscopy, surface analysis, film characterization, characterization of bulk substrates, and nanoparticle characterization.
For new visitors, Overview of capabilities are described at the top of each topic landing page.
Bio-characterization
Electrical and Magnetic Properties
- Cascade PMC 200 DC/RF Probe Station
- EverBeing EB-6 Probe Station
- Jandel 4-point Probe
- Lakeshore DC Probe Station
- MDC Mercury Probe
- MM 6000 Cleanroom DC Probe Station
- MM P200L Semi-Automatic Probe Station
- MMR H-50 Hall Effect Station
- Oxford Triton Dilution Refrigerator
- Probe 1 - Cascade MPS150 DC Probe Station
- Probe 2 - MM 6000 DC Probe Station
- Quantum Design DynaCool PPMS
- Quantum Design MPMS-3 SQUID Magnetometer
- Suss PLV50 DC Probe Station
Electron Microscopy
- Hitachi S-4800 Field Emission SEM
- Thermo Scientific Apreo SEM
- Jeol JCM 5000 Neoscope SEM
- Helios G4 UX Dual Beam - Thermo Scientific
- Themis Z Aberration Corrected Scanning/Transmission Electron Microscope
- EM Sample Prep
- Sample Prep
Optical Characterization
- Leica DCM8 Confocal Microscope
- Nanonics near-field optical microscope
- Nikon Eclipse L150 Industrial Microscope
- Olympus BX51 System Metallurgical Microscope
- Cleanroom Ellipsometer
- Filmetrics F10-RT
- Filmetrics F40-UV
- J.A. Woollam V-VASE UV-VIS-NIR spectroscopic ellipsometer
- Thermo Scientific DXR3xi Raman Imaging Microscope
- Keyence VHX-950F Digital Microscope
- Olympus BX60 System Microscope
- PerkinElmer Lambda950 UV-VIS-NIR spectrophotometer
- Thin Film Stress Machine
- Polytec Laser Doppler Vibrometer
- Kruss DSA25 Drop Shape Analyzer
- J.A. Woollam RC2 Spectroscopic Ellipsometer
Profilometry
Roll-to-Roll Characterization
Scanning Probe Microscopy
- Cleanroom AFM (Nanoman)- Veeco Dimension 3100
- Bruker Catalyst AFM
- Dimension 3100 Scanning Probe Microscope (Veeco, BRK1265)
- Asylum MFP-3D-BIO Atomic Force Microscope
- Asylum Cypher
- Park NX20 AFM
Surface Characterization
- Kratos X-ray Photoelectron Spectrometer
- Omicron Surface Analysis Cluster
- Panalytical X'pert Pro (XRD)
- Glovebox - BRK 1077
- Glovebox - Kratos Axis Ultra DLD XPS